Durable resistance to stripe rust in wheat: integration of breeding tools and genomic technologies

Stripe rust, caused by Puccinia striiformis f. sp., is a widespread and serious fungal disease that affects wheat (Triticum aestivum L.) cultivation worldwide. Its rapid development, high adaptability, and ability to cause significant yield losses threaten global food security. Although conventional breeding strategies play a role, they are limited by the evolutionary dynamics of the pathogen. Therefore, genomic and molecular approaches have been employed to improve resistance breeding techniques. This review summarizes relevant research findings on the pathogenicity of Pst and the genetic basis of resistance to stripe rust, categorized as all-stage resistance (ASR) and adult plant resistance (APR). More than 300 QTLs and 86 yellow rust (Yr) resistance genes have been identified through marker-assisted selection (MAS), quantitative trait loci (QTL) mapping, and genome-wide association studies (GWAS). Meta-QTL analyses have advanced to the point where fine-tuning candidate gene regions across different backgrounds is possible, facilitating marker-assisted breeding in closed systems. In addition, genomic selection (GS) enables the combined use of major and minor resistance loci when selecting for multiple traits, allowing rapid gene pyramiding to improve durability. Recent developments in CRISPR/Cas9 genome editing and pan-genomics offer the opportunity to induce a broad spectrum of durable resistance in elite wheat lines. Collectively, these integrative genomic approaches hold promise for sustainable strategies to combat the persistent threat of stripe rust and protect wheat production worldwide.